Structural modifications in stretch-induced crystallization in PVDF films as measured by small-angle X-ray scattering

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

The nanostructure of stretched and nonstretched PVDF samples was studied by small-angle X-ray scattering (SAXS). The crystallinity of the samples was determined by wide-angle X-ray diffraction (WAXD) and differential scanning calorimetry (DSC), and crystalline phases by Fourier transform infrared spectroscopy (FTIR). The nanostructure can be described by a lamellar stacking of crystalline and amorphous layers, with a fairly well defined long period D and a diffuse-boundary in the interface between the crystalline and amorphous phases. The crystallinity of the stretched sample was found to be greater than that of the nonstretched sample. The long period D and the thicknesses of the crystalline lamellae Tc were found to be greater in the stretched sample than those in the nonstretched sample. The thickness of the diffuse-boundary was evaluated as being similar to 1.4 nm in the nonstretched sample and 1.1 nm in the stretched sample. It was concluded that the growth of the thickness of the crystalline layer induced by the stretching process (stretch-induced crystallization) occurs partially at expense of the diffuse boundary and also by the coarsening of the structure with the stretching process, because of the diminution in the surface area to volume ratio observed. (C) 2011 Wiley Periodicals, Inc. J Appl Polym Sci, 2012