Phase-Locked Loop design applied to frequency-modulated atomic force microscope
| Contribuinte(s) |
Universidade Estadual Paulista (UNESP) |
|---|---|
| Data(s) |
30/09/2013
20/05/2014
30/09/2013
20/05/2014
01/09/2011
|
| Resumo |
Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) The atomic force microscope (AFM) introduced the surface investigation with true atomic resolution. In the frequency modulation technique (FM-AFM) both the amplitude and the frequency of oscillation of the micro-cantilever must be kept constant even in the presence of tip-surface interaction forces. For that reason, the proper design of the Phase-Locked Loop (PLL) used in FM-AFM is vital to system performance. Here, the mathematical model of the FM-AFM control system is derived considering high order PLL In addition a method to design stable third-order Phase-Locked Loops is presented. (C) 2010 Elsevier B.V. All rights reserved. |
| Formato |
3835-3843 |
| Identificador |
http://dx.doi.org/10.1016/j.cnsns.2010.12.018 Communications In Nonlinear Science and Numerical Simulation. Amsterdam: Elsevier B.V., v. 16, n. 9, p. 3835-3843, 2011. 1007-5704 http://hdl.handle.net/11449/24909 10.1016/j.cnsns.2010.12.018 WOS:000290368700040 |
| Idioma(s) |
eng |
| Publicador |
Elsevier B.V. |
| Relação |
Communications in Nonlinear Science and Numerical Simulation |
| Direitos |
closedAccess |
| Palavras-Chave | #Frequency-modulated atomic force microscopy #Phase-Locked Loops #Nonlinear dynamics #Mathematical model |
| Tipo |
info:eu-repo/semantics/article |
