Disorder effects produced by the Mn and H incorporations on the optical absorption edge of Ga1-xMnxAs:H nanocrystalline films


Autoria(s): Pereira, Andre L. J.; Silva, José Humberto Dias da
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

15/12/2008

Resumo

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Processo FAPESP: 05/02249-0

Processo FAPESP: 05/03463-5

The optical absorption edges of nanocrystalline Ga1-xMnxAs:H films (0.000 <= x <= 0.081) prepared by sputtering were analyzed. The influence of Mn and hydrogen incorporations were both investigated. The energy dispersive X-ray spectroscopy and X-ray diffraction measurements show that the films are nanocrystalline and do not display any evidence of Mn segregation, or of any other secondary phase formation. The transmittance measurements in the ultraviolet-visible-near infrared range allow us to calculate the absorption coefficient, the optical gap, and the Urbach energy. The hydrogenated Ga1-xMnxAs films presented wider gaps and smaller Urbach energies than its non-hydrogenated counterparts. In the hydrogenated films a linear correlation was observed between the decrease of the optical gap and the increase of the Urbach energy, which we have attributed to potential fluctuations and disorder induced by the Mn incorporation. (C) 2008 Elsevier B.V. All rights reserved.

Formato

5372-5377

Identificador

http://dx.doi.org/10.1016/j.jnoncrysol.2008.09.025

Journal of Non-crystalline Solids. Amsterdam: Elsevier B.V., v. 354, n. 52-54, p. 5372-5377, 2008.

0022-3093

http://hdl.handle.net/11449/8483

10.1016/j.jnoncrysol.2008.09.025

WOS:000261710700006

Idioma(s)

eng

Publicador

Elsevier B.V.

Relação

Journal of Non-Crystalline Solids

Direitos

closedAccess

Palavras-Chave #Amorphous semiconductors #III-V semiconductors #Crystallization #Nanocrystals #Films and coatings #Sputtering #Microstructure #Microcrystallinity #Optical properties #Absorption
Tipo

info:eu-repo/semantics/article