Investigation of microwave dielectric relaxation solid state process in the antiferroelectric phase of NaNbO3 ceramics


Autoria(s): Lente, M. H.; Guerra, JDS; Eiras, J. A.; Lanfredi, S.
Contribuinte(s)

Universidade Estadual Paulista (UNESP)

Data(s)

20/05/2014

20/05/2014

01/08/2004

Resumo

This letter reports microwave dielectric measurements performed in the antiferroelectric phase of NaNbO3 ceramics from 100 to 450 K. Remarkable dielectric relaxation was found within the antiferroelectric phase and in the vicinity of the ferroelectric-antiferroelectric phase transition. Such dielectric relaxation process was associated with relaxations of polar nanoregions with strong relaxor-like characteristic. In addition, the microwave dielectric measurements also revealed an unexpected and unusual anomaly in the relaxation strength, which was related to a disruption of the antiferroelectric order induced by a possible AFE-AFE phase transition. (C) 2004 Elsevier Ltd. All rights reserved.

Formato

279-282

Identificador

http://dx.doi.org/10.1016/j.ssc.2004.05.035

Solid State Communications. Oxford: Pergamon-Elsevier B.V., v. 131, n. 5, p. 279-282, 2004.

0038-1098

http://hdl.handle.net/11449/6799

10.1016/j.ssc.2004.05.035

WOS:000223011600001

Idioma(s)

eng

Publicador

Elsevier B.V.

Relação

Solid State Communications

Direitos

closedAccess

Palavras-Chave #antiferroelectrics #dielectric relaxation #microwave #relaxor
Tipo

info:eu-repo/semantics/article