Modeling the effect of latent extreme response and sample attrition biases


Autoria(s): Lee, Alvin; Mizerski, Richard
Data(s)

01/01/2009

Identificador

http://hdl.handle.net/10536/DRO/DU:30076058

Idioma(s)

eng

Publicador

Henan University of Finance and Economics

Direitos

2009, Henan University of Finance and Economics

Tipo

Other