Univariate and multivariate process yield indices based on location-scale family of distributions

Several measures of process yield, defined on univariate and multivariate normal process characteristics, have been introduced and studied by several authors. These measures supplement several well-known Process Capacity Indices (PCI) used widely in assessing the quality of products before being released into the marketplace. In this paper, we generalise these yield indices to the location-scale family of distributions which includes the normal distribution as one of its member. One of the key contributions of this paper is to demonstrate that under appropriate conditions, these indices converge in distribution to a normal distribution. Several numerical examples will be used to illustrate our procedures and show how they can be applied to perform statistical inferences on process capability.