Investigation of aging devices in power network

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Autoria(s): Al-Khalidi, H.; Kalam, A.; Oo, Amanullah M. T.

Contribuinte(s)	[Unknown]
Data(s)	01/01/2006
Identificador	http://hdl.handle.net/10536/DRO/DU:30056490
Idioma(s)	eng
Publicador	IEEE
Palavras-Chave	#power system #ageing #digital devices #reliability
Tipo	Conference Paper