Structural characterization of SiO2 and Al2O 3 zener-pinned nanocrystalline TiO2 by NMR, XRD and electron microscopy

Autoria(s): O’Dell, L.A.; Savin, S.L.P; Chadwick, A.V.; Smith, M.E.
Data(s)

20/09/2007
Identificador

http://hdl.handle.net/10536/DRO/DU:30055628
Idioma(s)

eng
Publicador

American Chemical Society
Relação

http://dro.deakin.edu.au/eserv/DU:30055628/odell-structuralcharacterizationsio-2007.pdf

http://doi.org/10.1021/jp0739871
Direitos

2007, American Chemical Society
Palavras-Chave #nanocrystalline #sol-gel #zener-pinned #silica #alumina #electron microscopy #nuclear magnetic resonance #titanium dioxide
Tipo

Journal Article
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