Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy

Autoria(s): Salina, D.M.; Cheary, R.W.; Swift, P.D.; Dligatch, S.; McCredie, G.M.; Gong, B.; Lynch, P.A.
Data(s)

01/01/2000
Identificador

http://hdl.handle.net/10536/DRO/DU:30052459
Idioma(s)

eng
Publicador

Elsevier
Relação

http://dro.deakin.edu.au/eserv/DU:30052459/lynch-investigationof-2000.pdf

http://dx.doi.org/10.1016/S0040-6090(00)01044-0
Direitos

2000, Elsevier
Palavras-Chave #multilayers #platinum #thin films #interfaces #x-ray reflectivity #x-ray photoelectron spectroscopy #magnetron sputtering #electron beam evaporation
Tipo

Journal Article
Acesso ao item digital