Characterisation of ultra-thin platinum films by Xray line broadening analysis

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Autoria(s): Lynch, P.A.; Cheary, R.W.

Contribuinte(s)	Olsson-Jacques, Christina
Data(s)	01/01/1999
Identificador	http://hdl.handle.net/10536/DRO/DU:30052443
Idioma(s)	eng
Publicador	The Association
Direitos	1999, The Authors
Tipo	Conference Paper