Line profile analysis of stacking faults and dislocations in DC magnetron sputtered gold films

Autoria(s): Lynch, P.A.; Cheary, R.W.; Dooryhee, E.; Armstrong, N.
Contribuinte(s)

[Unknown]
Data(s)

01/01/2001
Identificador

http://hdl.handle.net/10536/DRO/DU:30052441
Idioma(s)

eng
Publicador

National Institute of Standards and Technology
Direitos

2001, National Institute of Standards and Technology
Tipo

Conference Paper
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