X-ray diffraction characterisation of nanoparticle size and shape distributions : application to bimodal distributions
Contribuinte(s) |
[Unknown] |
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Data(s) |
01/01/2004
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Identificador | |
Idioma(s) |
eng |
Publicador |
[The Conference] |
Palavras-Chave | #Bayesian/Maximum entropy #Markov Chain Monte Carlo (MCMC) #SRM #XRD |
Tipo |
Conference Paper |