Evaluation of reliability of transparent SiOCH by electrochemical methods

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Autoria(s): Nam, N. D.; Kim, J. G.; Kim, D. J.; Lee, N. E.

Contribuinte(s)	[Unknown]
Data(s)	01/01/2007
Identificador	http://hdl.handle.net/10536/DRO/DU:30049256
Idioma(s)	eng
Publicador	DPS
Tipo	Conference Paper