Extending the surface force apparatus capabilities by using white light interferometry in reflection
Data(s) |
01/11/2003
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Resumo |
The application of surface force apparatus (SFA) capabilities in measuring interactions between surfaces over nanometer separations was described. The technique is used when both the materials are transparent. It was observed that the poorly reflecting surface produce fringes that have low contrast and low finesse. The results show that the technique is successful when the visibility of the interference fringes is maximized.<br /> |
Identificador | |
Idioma(s) |
eng |
Publicador |
American Institute of Physics |
Relação |
http://dro.deakin.edu.au/eserv/DU:30041440/horn-extendingthesurface-2003.pdf http://dx.doi.org/10.1063/1.1619551 |
Direitos |
2003, American Institute of Physics |
Palavras-Chave | #Atomic force microscopy #Hydrodynamics #Interferometers #Interferometry #Light interference #Light transmission #Reflective coatings |
Tipo |
Journal Article |