Possible electrical double-layer contribution to the equilibrium thickness of intergranular Glass films in polycrystalline ceramics


Autoria(s): Clarke, David R.; Shaw, Thomas M.; Philipse, Albert P.; Horn, Roger G.
Data(s)

01/05/1993

Resumo

The plausibility of the entropic repulsion of electrical double layers acting to stabilize an equilibrium thickness of intergranular glass films in polycrystalline ceramics is explored. Estimates of the screening length, surface potential, and surface charge required to provide a repulsive force sufficiently large to balance the attractive van der Waals and capillary forces for observable thicknesses of intergranular film are calculated and do not appear to be beyond possibility. However, it has yet to be established whether crystalline particles in a liquid-phase sintering medium possess an electrical double layer at high temperatures. If they do, such a surface charge layer may well have important consequences not only for liquid-phase sintering but also for high-frequency electrical properties and microwave sintering of ceramics containing a liquid phase.<br />

Identificador

http://hdl.handle.net/10536/DRO/DU:30041435

Idioma(s)

eng

Publicador

Wiley-Blackwell Publishing

Relação

http://dx.doi.org/10.1111/j.1151-2916.1993.tb03741.x

Direitos

1993, Wiley-Blackwell

Palavras-Chave #Electrical Double-Layer Contribution #Equilibrium Thickness #Intergranular Glass Films #Polycrystalline Ceramics
Tipo

Journal Article