TOF-SIMS analysis using C60. Effect of impact energy on yield and damage

C₆₀ has been shown to give increased sputter yields and, hence, secondary ions when used as a primary particle in SIMS analysis. In addition, for many samples, there is also a reduction in damage accumulation following continued bombardment with the ion beam. In this paper, we report a study of the impact energy (up to 120 keV) of C₆₀ on the secondary ion yield from a number of samples with consideration of any variation in yield response over mass ranges up to <i>m/z</i> 2000. Although increased impact energy is expected to produce a corresponding increase in sputter yield/rate, it is important to investigate any increase in sample damage with increasing energy and, hence, efficiency of the ion beams. On our test samples including a metal, along with organic samples, there is a general increase in secondary ion yield of high-mass species with increasing impact energy. A corresponding reduction in the formation of low-mass fragments is also observed. Depth profiling of organic samples demonstrates that when using C₆₀, there does not appear to be any increase in damage evident in the mass spectra as the impact energy is increased.<br />