Characterization of membranes with X-ray ultramicroscopy

Non-invasive characterization and observation of synthetic membranes is an important practice to monitor the performance of membrane process. Primarily there are two techniques—optical and non-optical for this purpose. Among them, X-ray computed tomography, as a non-optical technique, has been extensively used for the measurement of fibre distribution and air pockets trapped in the modules. However, the micro resolution of most commercial systems has limited its application which can hardly be used for the sub-micro characterization of membrane processes. A novel micro and nano characterization method is introduced in the current work by exploring an innovative development of the X-ray ultramicroscope (XuM) and micro-tomographic techniques. The XuM, based on using a scanning electron microscope as host, provides a new approach to X-ray projection microscopy. It has demonstrated the ability to characterize very small features in objects, down to of order 100 nm, including the use for dry, wet and even liquid samples. It can also distinguish objects with very subtle difference in density.<br />