Deformation twinning and the hall-petch relation in commercial purity ti
Data(s) |
01/04/2008
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Resumo |
The effect of grain size and deformation temperature on the behavior of wire-drawn a-Ti during compression has been examined. At strains of 0.3, the flow stress exhibited a negative Hall–Petch slope. This is proposed to result from the prevalence of twinning during the compressive deformation. Electron backscattered diffraction revealed that {1012} was the most prolific twin type across all the deformation temperatures and grain sizes examined. Of the twinning modes observed, {1122} twinning was the most sensitive to the grain size and deformation temperature. The range of morphologies exhibited by deformation twins is also described.<br /> |
Identificador | |
Idioma(s) |
eng |
Publicador |
Springer Boston |
Relação |
http://dro.deakin.edu.au/eserv/DU:30017325/barnett-deformationtwinning-2008.pdf http://dx.doi.org/10.1007/s11661-007-9442-9 |
Direitos |
2008, Springer |
Tipo |
Journal Article |