An investigation of the native oxide of aluminum alloy 7475-T7651 using XPS, AES, TEM, EELS, GDOES and RBS

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Autoria(s): Toh, S. K.; McCulloch, D.; du Plessis, Johan; Paterson, P. J. K.; Hughes, A. E.; Jamieson, D.; Rout, B.; Long, John; Stonham, A.

Data(s)	01/01/2002
Identificador	http://hdl.handle.net/10536/DRO/DU:30015662
Idioma(s)	eng
Publicador	World Scientific
Tipo	Conference Paper