Depth-profile analysis of elements by glow discharge optical emmission specrometry
Data(s) |
01/01/2001
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Resumo |
Glow-discharge optical emission spectrometry (GD-OES) is a powerful tool for the rapid analysis of elements in the surface of solids. One may employ GD-OES to determine quantitatively the bulk concentration of elements in a sample. With further calibration, one may also obtain elemental concentrations as a function of depth into the sample. This allows depth profiling on a host of advanced materials: treated metals, coated metals and other materials, multi-layers, painted surfaces, hard samples coated with polymers, thin films, and many others.<br /><br />A consortium of institutions in Victoria, led by Deakin University, has purchased a new glow-discharge optical emission spectrometer. This instrument has the ability to perform elemental depth profiling on a wide range of materials. This technique, the first of its kind in Australia, is of particular interest to those working on metals, ceramics, glasses, coatings, semi-conductors, and multi-layers. We present here an overview of depth profiling by GD-OES and some examples of its use. <br /> |
Identificador | |
Idioma(s) |
eng |
Publicador |
Australian Institute for Non Destructive Testing |
Relação |
http://dro.deakin.edu.au/eserv/DU:30015577/long-depthprofile-2001.pdf http://www.ndt.net/apcndt2001/papers/1134/1134.htm |
Direitos |
2001, Australian Institute for Non Destructive Testing |
Palavras-Chave | #GD-OES #glow discharge #depth profiling #surface analysis #emission spectrometry |
Tipo |
Conference Paper |