An extended negative selection algorithm for anomaly detection

This paper proposes an extended negative selection algorithm for anomaly detection. Unlike previously proposed negative selection algorithms which do not make use of non-self data, the extended negative selection algorithm first acquires prior knowledge about the characteristics of the Problem space from the historial sample data by using machine learning techniques. Such data consists of both self data and non-self data. The acquired prior knowledge is represented in the form of production rules and thus viewed as common schemata which characterise the two subspaces: self-subspace and non-self-subspace, and provide important information to the generation of detection rules. One advantage of our approach is that it does not rely on the structured representation of the data and can be applied to general anomaly detection. To test the effectiveness, we test our approach through experiments with the public data set iris and KDDrsquo99 published data set.<br />