The interaction between atoms of Au and Cu with clean Si(111) surface: A study combining synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations
| Contribuinte(s) |
UNIVERSIDADE DE SÃO PAULO |
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| Data(s) |
20/10/2012
20/10/2012
2009
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| Resumo |
In order to evaluate the interactions between Au/Cu atoms and clean Si(l 11) surface, we used synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations. Optimized geometries and energies on different adsorption sites indicate that the binding energies at different adsorption sites are high, suggesting a strong interaction between metal atom and silicon surface. The Au atom showed higher interaction than Cu atom. The theoretical and experimental data showed good agreement. Crown Copyright (C) 2009 Published by Elsevier B.V. All rights reserved. FAPEMIG Fundação de Amparo à Pesquisa do Estado de Minas Gerais (FAPEMIG) Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) CNPq Brazilian Synchrotron Light Laboratory (LNLS) Brazilian Synchrotron Light Source (LNLS)[D09B-XRF 6637/07] Brazilian Synchrotron Light Source (LNLS)[LMF 7723] Brazilian Synchrotron Light Laboratory (LNLS) |
| Identificador |
SPECTROCHIMICA ACTA PART A-MOLECULAR AND BIOMOLECULAR SPECTROSCOPY, v.74, n.1, p.292-296, 2009 1386-1425 http://producao.usp.br/handle/BDPI/31505 10.1016/j.saa.2009.06.021 |
| Idioma(s) |
eng |
| Publicador |
PERGAMON-ELSEVIER SCIENCE LTD |
| Relação |
Spectrochimica Acta Part A-molecular and Biomolecular Spectroscopy |
| Direitos |
restrictedAccess Copyright PERGAMON-ELSEVIER SCIENCE LTD |
| Palavras-Chave | #Total X-ray reflection #Grazing incidence X-ray fluorescence (GIXRF) analysis #Semiconductor surface #ADSORPTION #MECHANISM #FILMS #Spectroscopy |
| Tipo |
article original article publishedVersion |
