Two- and three-dimensional shape fabric analysis by the intercept method in grey levels
Contribuinte(s) |
UNIVERSIDADE DE SÃO PAULO |
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Data(s) |
20/10/2012
20/10/2012
2010
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Resumo |
The count intercept is a robust method for the numerical analysis of fabrics Launeau and Robin (1996). It counts the number of intersections between a set of parallel scan lines and a mineral phase, which must be identified on a digital image. However, the method is only sensitive to boundaries and therefore supposes the user has some knowledge about their significance. The aim of this paper is to show that a proper grey level detection of boundaries along scan lines is sufficient to calculate the two-dimensional anisotropy of grain or crystal distributions without any particular image processing. Populations of grains and crystals usually display elliptical anisotropies in rocks. When confirmed by the intercept analysis, a combination of a minimum of 3 mean length intercept roses, taken on 3 more or less perpendicular sections, allows the calculation of 3-dimensional ellipsoids and the determination of their standard deviation with direction and intensity in 3 dimensions as well. The feasibility of this quick method is attested by numerous examples on theoretical objects deformed by active and passive deformation, on BSE images of synthetic magma flow, on drawing or direct analysis of thin section pictures of sandstones and on digital images of granites directly taken and measured in the field. (C) 2010 Elsevier B.V. All rights reserved. Universidade de São Paulo (USP) University of Sao Paulo (USP) FAPESP[01/14154-2] Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) FAPESP[04/13121-1] Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) FAPESP[01/10626-7] French Program ANR-EXPLANT[ANR-05-CATT-003] French Program ANR-EXPLANT |
Identificador |
TECTONOPHYSICS, v.492, n.1/Abr, p.230-239, 2010 0040-1951 http://producao.usp.br/handle/BDPI/30232 10.1016/j.tecto.2010.06.005 |
Idioma(s) |
eng |
Publicador |
ELSEVIER SCIENCE BV |
Relação |
Tectonophysics |
Direitos |
restrictedAccess Copyright ELSEVIER SCIENCE BV |
Palavras-Chave | #Shape preferred orientation #Fabric #Structural geology #Intercepts #Image analysis #MEASURED SECTIONAL ELLIPSES #TWO-DIMENSIONAL STRAIN #MECHANICAL INTERACTIONS #PREFERRED ORIENTATION #MAGMATIC ROCKS #FLOW #EMPLACEMENT #PLANE #LINES #Geochemistry & Geophysics |
Tipo |
article original article publishedVersion |