Thickness and Annealing Temperature Effects on the Optical Properties and Surface Morphology of Layer-by-Layer Poly(p-phenyline vinylene) plus Dodecylbenzenesulfonate Films


Autoria(s): THEREZIO, Eralci Moreira; PIOVESAN, Erick; VEGA, Maria Leticia; SILVA, Raigna A.; OLIVEIRA JUNIOR, Osvaldo Novais de; MARIETTA, Alexandre
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

20/10/2012

20/10/2012

2011

Resumo

The fabrication of controlled molecular architectures is essential for organic devices, as is the case of emission of polarized light for the information industry. In this study, we show that optimized conditions can be established to allow layer-by-layer (LbL) films of poly(p-phenylene vinylene) (PPV)+dodecylbenzenesulfonate (DBS) to be obtained with anisotropic properties. Films with five layers and converted at 110 degrees C had a dichroic ratio delta = 2.3 and order parameter r = 34%, as indicated in optical spectroscopy and emission ellipsometry data. This anisotropy was decreased with the number of layers deposited, with delta = 1.0 for a 75-layer LbL PPV + DBS film. The analysis with atomic force microscopy showed the formation of polymer clusters in a random growth process with the normalized height distribution being represented by a Gaussian function. In spite of this randomness in film growth, the self-covariance function pointed to a correlation between clusters, especially for thick films. In summary, the LbL method may be exploited to obtain both anisotropic films with polarized emission and regular, nanostructured surfaces. (c) 2010 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 49: 206-213, 2011

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

CAPES

FAPEMIG

Fundação de Amparo à Pesquisa do Estado de Minas Gerais (FAPEMIG)

CNPq

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

FAPESP

INEO (Brazil)

INEO (Brazil)

Identificador

JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS, v.49, n.3, p.206-213, 2011

0887-6266

http://producao.usp.br/handle/BDPI/29824

10.1002/polb.22180

http://dx.doi.org/10.1002/polb.22180

Idioma(s)

eng

Publicador

WILEY-BLACKWELL PUBLISHING, INC

Relação

Journal of Polymer Science Part B-polymer Physics

Direitos

restrictedAccess

Copyright WILEY-BLACKWELL PUBLISHING, INC

Palavras-Chave #atomic force microscopy (AFM) #conjugated polymers #ellipsometry #layer-by-layer technique #optical characterization #organic semiconductors #photophysics #surface morphology #POLYMERS #Polymer Science
Tipo

article

original article

publishedVersion