Texture analysis using graphs generated by deterministic partially self-avoiding walks


Autoria(s): BACKES, Andre R.; MARTINEZ, Alexandre S.; BRUNO, Odemir Martinez
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

20/10/2012

20/10/2012

2011

Resumo

Texture is one of the most important visual attributes for image analysis. It has been widely used in image analysis and pattern recognition. A partially self-avoiding deterministic walk has recently been proposed as an approach for texture analysis with promising results. This approach uses walkers (called tourists) to exploit the gray scale image contexts in several levels. Here, we present an approach to generate graphs out of the trajectories produced by the tourist walks. The generated graphs embody important characteristics related to tourist transitivity in the image. Computed from these graphs, the statistical position (degree mean) and dispersion (entropy of two vertices with the same degree) measures are used as texture descriptors. A comparison with traditional texture analysis methods is performed to illustrate the high performance of this novel approach. (C) 2011 Elsevier Ltd. All rights reserved.

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

CNPq (National Council for Scientific and Technological Development, Brazil)[303990/2007-4]

CNPq (National Council for Scientific and Technological Development, Brazil)[476722/2010-1]

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

CNPq (National Council for Scientific and Technological Development, Brazil)[306628/2007-4]

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)

CNPq (National Council for Scientific and Technological Development, Brazil)[484474/2007-3]

FAPESP (The State of Sao Paulo Research Foundation)[2006/54367-9]

Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)

Identificador

PATTERN RECOGNITION, v.44, n.8, p.1684-1689, 2011

0031-3203

http://producao.usp.br/handle/BDPI/29622

10.1016/j.patcog.2011.01.018

http://dx.doi.org/10.1016/j.patcog.2011.01.018

Idioma(s)

eng

Publicador

ELSEVIER SCI LTD

Relação

Pattern Recognition

Direitos

restrictedAccess

Copyright ELSEVIER SCI LTD

Palavras-Chave #Texture analysis #Deterministic partially self-avoiding walk #Graph theory #FRACTAL DIMENSION #COMPLEX NETWORKS #TOURIST WALKS #GABOR FILTERS #CLASSIFICATION #IMAGES #SEGMENTATION #WAVELET #MICROSCOPE #FEATURES #Computer Science, Artificial Intelligence #Engineering, Electrical & Electronic
Tipo

article

original article

publishedVersion