Photo-irradiation effects on the surface morphology of poly(p-phenylene vinylene) films
Contribuinte(s) |
UNIVERSIDADE DE SÃO PAULO |
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Data(s) |
20/10/2012
20/10/2012
2010
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Resumo |
In this work, we have studied the surface morphology of photo-irradiated poly(p-phenylene vinylene) (PPV) thin films by using atomic force microscopy (AFM). We have analyzed the first-order statistical parameters, the height distribution and the distance between selected peaks. The second-order statistical analysis was introduced calculating the auto-covariance function to determine the correlation length between heights. We have observed that the photo-irradiation process produces a surface topology more homogeneous and isotropic such as a normal surface. In addition, the polymer surface irradiation can be used as a new methodology to obtain materials optically modified. (C) 2009 Elsevier B.V. All rights reserved. Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) Fundacao de Amparo a Pesquisa do Estado de Sao Paulo (FAPESP) Fundacao de Amparo a Pesquisa do Estado de Minas Gerais (FAPEMIG) Fundação de Amparo à Pesquisa do Estado de Minas Gerais (FAPEMIG) Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) Conselho Nacional de Desenvolvimento Cientifico e Tecnologico (CNPq) Instituto do Milenio de Materiais Polimericos do Ministerio de Ciencia e Tecnologia (IMMP/MCT) Ministério da Ciência, Tecnologia e Inovação do Brasil (MCTI) |
Identificador |
APPLIED SURFACE SCIENCE, v.256, n.10, p.3018-3023, 2010 0169-4332 http://producao.usp.br/handle/BDPI/29621 10.1016/j.apsusc.2009.11.066 |
Idioma(s) |
eng |
Publicador |
ELSEVIER SCIENCE BV |
Relação |
Applied Surface Science |
Direitos |
restrictedAccess Copyright ELSEVIER SCIENCE BV |
Palavras-Chave | #Atomic force microscopy #Surface morphology #Conjugated polymers #Statistical analysis #ATOMIC-FORCE MICROSCOPY #POLYMERS #Chemistry, Physical #Materials Science, Coatings & Films #Physics, Applied #Physics, Condensed Matter |
Tipo |
article original article publishedVersion |