Structural characterization of supported nanocrystalline ZnO thin films prepared by dip-coating
Contribuinte(s) |
UNIVERSIDADE DE SÃO PAULO |
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Data(s) |
20/10/2012
20/10/2012
2011
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Resumo |
Nanocrystalline ZnO thin films prepared by the sol-gel dip-coating technique were characterized by grazing incidence X-ray diffraction (GIXD), atomic force microscopy (AFM), X-ray reflectivity (XR) and grazing incidence small-angle X-ray scattering (GISAXS). The structures of several thin films subjected to (i) isochronous annealing at 350, 450 and 550 degrees C, and (ii) isothermal annealing at 450 degrees C during different time periods, were characterized. The studied thin films are composed of ZnO nanocrystals as revealed by analysing several GIXD patterns, from which their average sizes were determined. Thin film thickness and roughness were determined from quantitative analyses of AFM images and XR patterns. The analysis of XR patterns also yielded the average density of the studied films. Our GISAXS study indicates that the studied ZnO thin films contain nanopores with an ellipsoidal shape, and flattened along the direction normal to the substrate surface. The thin film annealed at the highest temperature, T = 550 degrees C, exhibits higher density and lower thickness and nanoporosity volume fraction, than those annealed at 350 and 450 degrees C. These results indicate that thermal annealing at the highest temperature (550 degrees C) induces a noticeable compaction effect on the structure of the studied thin films. (C) 2011 Elsevier B.V. All rights reserved. Brazilian Synchrotron Light Laboratory (LNLS) LNLS Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) FAPESP SECyT Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) CAPES/SECyT CNPq/CONICET Consejo Nacional de Investigaciones Científicas y Técnicas de Argentina (CONICET) Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) CNPq (PROSUL) ANPCyT Agencia Nacional de Promoción Científica y Tecnológica (ANPCyT) CONICET Consejo Nacional de Investigaciones Científicas y Técnicas de Argentina (CONICET) YPF Foundation YPF Foundation |
Identificador |
APPLIED SURFACE SCIENCE, v.257, n.23, p.10045-10051, 2011 0169-4332 http://producao.usp.br/handle/BDPI/29034 10.1016/j.apsusc.2011.06.136 |
Idioma(s) |
eng |
Publicador |
ELSEVIER SCIENCE BV |
Relação |
Applied Surface Science |
Direitos |
restrictedAccess Copyright ELSEVIER SCIENCE BV |
Palavras-Chave | #ZnO #Nanostructured thin films #XR #GISAXS #X-RAY-SCATTERING #Chemistry, Physical #Materials Science, Coatings & Films #Physics, Applied #Physics, Condensed Matter |
Tipo |
article original article publishedVersion |