Extending Murty interferometry to the Terahertz part of the spectrum

We discuss some novel technologies that enable the implementation of shearing interferometry at the terahertz part of the spectrum. Possible applications include the direct measurement of lens parameters, the measurement of refractive index of materials that are transparent to terahertz frequencies, determination of homogeneity of samples, measurement of optical distortions and the non-contact evaluation of thermal expansion coefficient of materials buried inside media that are opaque to optical or infrared frequencies but transparent to THz frequencies. The introduction of a shear to a Gaussian free-space propagating terahertz beam in a controlled manner also makes possible a range of new encoding and optical signal processing modalities.