The hardness profile as a tool to detect spurious stationary points in the potential energy surface


Autoria(s): Torrent Sucarrat, Miquel; Luis Luis, Josep Maria; Duran i Portas, Miquel; Solà i Puig, Miquel
Data(s)

2004

Resumo

The energy and hardness profile for a series of inter and intramolecular conformational changes at several levels of calculation were computed. The hardness profiles were found to be calculated as the difference between the vertical ionization potential and electron affinity. The hardness profile shows the correct number of stationary points independently of the basis set and methodology used. It was found that the hardness profiles can be used to check the reliability of the energy profiles for those chemical system

Formato

application/pdf

Identificador

Torrent-Sucarrat, M., Luis, J.M., Duran, M., i Solà, M. (2004). The hardness profile as a tool to detect spurious stationary points in the potential energy surface. Journal of Chemical Physics, 120 (23), 10914-10924. Recuperat 8 febrer 2011,a http://link.aip.org/link/JCPSA6/v120/i23/p10914/s1

0021-9606 (versió paper)

1089-7690 (versió electrònica)

http://hdl.handle.net/10256/3227

http://dx.doi.org/10.1063/1.1742793

Idioma(s)

eng

Publicador

American Institute of Physics

Relação

Reproducció digital del document publicat a: http://dx.doi.org/10.1063/1.1742793

© Journal of Chemical Physics, 2004, vol. 120, núm. 23, p. 10914-10924

Articles publicats (D-Q)

Direitos

Tots els drets reservats

Palavras-Chave #Enllaços químics #Models matemàtics #Polarització (Electricitat) #Chemical bonds #Mathematical models #Polarization (Electricity)
Tipo

info:eu-repo/semantics/article