Microstructure and random magnetic anisotropy in Fe–Ni based nanocrystalline thin films


Autoria(s): Anantharaman, M R; Senoy, Thomas; Al-Harthi, S H; Sakthi Kumar, D; Al-Omari, I A; Ramanujan, R V; Yasuhiko, Yoshida
Data(s)

31/07/2014

31/07/2014

17/07/2008

Resumo

Nanocrystalline Fe–Ni thin films were prepared by partial crystallization of vapour deposited amorphous precursors. The microstructure was controlled by annealing the films at different temperatures. X-ray diffraction, transmission electron microscopy and energy dispersive x-ray spectroscopy investigations showed that the nanocrystalline phase was that of Fe–Ni. Grain growth was observed with an increase in the annealing temperature. X-ray photoelectron spectroscopy observations showed the presence of a native oxide layer on the surface of the films. Scanning tunnelling microscopy investigations support the biphasic nature of the nanocrystalline microstructure that consists of a crystalline phase along with an amorphous phase. Magnetic studies using a vibrating sample magnetometer show that coercivity has a strong dependence on grain size. This is attributed to the random magnetic anisotropy characteristic of the system. The observed coercivity dependence on the grain size is explained using a modified random anisotropy model

J. Phys. D: Appl. Phys. 41 (2008) 155009 (8pp)

Cochin University of Science and Technology

Identificador

http://dyuthi.cusat.ac.in/purl/4368

Idioma(s)

en

Publicador

IOP Publishing LTD

Tipo

Article