Characterizations of distributions using log odds rate


Autoria(s): Sunoj, S M; Sankaran, P G; Maya, S S
Data(s)

25/07/2014

25/07/2014

20/12/2006

Resumo

In this paper, we examine the relationships between log odds rate and various reliability measures such as hazard rate and reversed hazard rate in the context of repairable systems. We also prove characterization theorems for some families of distributions viz. Burr, Pearson and log exponential models. We discuss the properties and applications of log odds rate in weighted models. Further we extend the concept to the bivariate set up and study its properties.

Statistics, Vol. 41, No. 5, October 2007, 443–451

Cochin University of Science and Technology

Identificador

0233-1888 print/1029-4910 online

http://dyuthi.cusat.ac.in/purl/4283

Idioma(s)

en

Publicador

Taylor & Francis

Palavras-Chave #Log odds rate #Hazard rate #Reversed hazard rate #Weighted models
Tipo

Article