Identification of models using failure rate and mean residual life of doubly truncated random variables
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25/07/2014
25/07/2014
06/08/2002
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Resumo |
In this paper, we study the relationship between the failure rate and the mean residual life of doubly truncated random variables. Accordingly, we develop characterizations for exponential, Pareto 11 and beta distributions. Further, we generalize the identities for fire Pearson and the exponential family of distributions given respectively in Nair and Sankaran (1991) and Consul (1995). Applications of these measures in file context of lengthbiased models are also explored Statistical Papers 45, 97-109 (2004) Cochin University of Science and Technology |
Identificador | |
Idioma(s) |
en |
Publicador |
Springer |
Palavras-Chave | #Failure rate #Mean Residual Life #Length biased models |
Tipo |
Article |