Calorimetry of dehydrogenation and dangling-bond recombination in several hydrogenated amorphous silicon materials
Data(s) |
29/12/2009
29/12/2009
2006
|
---|---|
Formato |
15 p. application/pdf |
Identificador |
0163-1829 http://hdl.handle.net/2445/10649 535057 |
Idioma(s) |
eng |
Publicador |
The American Physical Society |
Relação |
Reproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.73.085203 Physical Review B, 2006, vol. 73, núm 8, p. 085203-1-085203-15 |
Direitos |
(c) The American Physical Society, 2006 info:eu-repo/semantics/openAccess |
Palavras-Chave | #Ciència dels materials #Semiconductors amorfs #Pel·lícules fines #Structure of solids and liquids #Materials science #Surfaces and interfaces #Thin films |
Tipo |
info:eu-repo/semantics/article |