Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique


Autoria(s): Rajasree, K; Ravi Kumar, A V; Radhakrishnan, P; Nampoori, V P N; Vallabhan, C P G
Data(s)

09/12/2011

09/12/2011

01/04/1992

Resumo

Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods.

Cochin University of Science and Technology

Identificador

0250-4707

Bull. Mater. Sci., Vol.15, No. 2, April 1992, pp. 183-188.

http://dyuthi.cusat.ac.in/purl/2629

http://dx.doi.org/10.1007/BF02927444

Idioma(s)

en

Publicador

Springer

Palavras-Chave #Photothermal deflection technique #damage threshold #polymer #Nd-YAG laser #He-Ne laser
Tipo

Working Paper