Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique
Data(s) |
09/12/2011
09/12/2011
01/04/1992
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Resumo |
Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods. Cochin University of Science and Technology |
Identificador |
0250-4707 Bull. Mater. Sci., Vol.15, No. 2, April 1992, pp. 183-188. |
Idioma(s) |
en |
Publicador |
Springer |
Palavras-Chave | #Photothermal deflection technique #damage threshold #polymer #Nd-YAG laser #He-Ne laser |
Tipo |
Working Paper |