Measurement of laser ablation threshold on doped BiSrCaCuO high temperature superconductors by the pulsed photothermal deflection technique


Autoria(s): Rajasree, K; Vidyalal, V; Radhakrishnan, P; Nampoori, V P N; Vallabhan, C P G
Data(s)

02/12/2011

02/12/2011

01/08/1993

Resumo

Laser‐induced damage and ablation thresholds of bulk superconducting samples of Bi2(SrCa)xCu3Oy(x=2, 2.2, 2.6, 2.8, 3) and Bi1.6 (Pb)xSr2Ca2Cu3 Oy (x=0, 0.1, 0.2, 0.3, 0.4) for irradiation with a 1.06 μm beam from a Nd‐YAG laser have been determined as a function of x by the pulsed photothermal deflection technique. The threshold values of power density for ablation as well as damage are found to increase with increasing values of x in both systems while in the Pb‐doped system the threshold values decrease above a specific value of x, coinciding with the point at which the Tc also begins to fall.  

Cochin University of Science and Technology

Identificador

J. Appl. Phys. 74 (3), 1 August 1993

http://dyuthi.cusat.ac.in/purl/2577

Idioma(s)

en

Publicador

American Institute of Physics

Palavras-Chave #ablation #laser radiation #power density #Bismuth oxides #Calcium oxides #Strontium oxides #copper oxides #lead oxides #Multi-element compounds #Superconducting films #transition temperature
Tipo

Working Paper