Measurement of laser ablation threshold on doped BiSrCaCuO high temperature superconductors by the pulsed photothermal deflection technique
Data(s) |
02/12/2011
02/12/2011
01/08/1993
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Resumo |
Laser‐induced damage and ablation thresholds of bulk superconducting samples of Bi2(SrCa)xCu3Oy(x=2, 2.2, 2.6, 2.8, 3) and Bi1.6 (Pb)xSr2Ca2Cu3 Oy (x=0, 0.1, 0.2, 0.3, 0.4) for irradiation with a 1.06 μm beam from a Nd‐YAG laser have been determined as a function of x by the pulsed photothermal deflection technique. The threshold values of power density for ablation as well as damage are found to increase with increasing values of x in both systems while in the Pb‐doped system the threshold values decrease above a specific value of x, coinciding with the point at which the Tc also begins to fall. Cochin University of Science and Technology |
Identificador |
J. Appl. Phys. 74 (3), 1 August 1993 |
Idioma(s) |
en |
Publicador |
American Institute of Physics |
Palavras-Chave | #ablation #laser radiation #power density #Bismuth oxides #Calcium oxides #Strontium oxides #copper oxides #lead oxides #Multi-element compounds #Superconducting films #transition temperature |
Tipo |
Working Paper |