Failure mode characterization in inkjet-printed cpw lines utilizing a high-frequency network analyzer and post-processed tdr analysis


Autoria(s): Cambridge, MA : Electromagnetics Academy
Contribuinte(s)

Myllymäki, Sami

Putaala, Jussi

Hannu, Jari

Jantunen, Heli

Mäntysalo, Matti

Kunnari, Esa

Data(s)

04/03/2014

04/03/2014

2013

Identificador

1937-8718

http://www.jpier.org/PIERC/pierc43/01.13052104.pdf

Idioma(s)

en_US

Publicador

Cambridge, MA : Electromagnetics Academy

Relação

Progress in electromagnetics research C

Progress in electromagnetics research C

43

Weng Cho Chew

Direitos

2

Palavras-Chave #elektroniikka #tulostettava elektroniikka #luotettavuus
Tipo

A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä (Journal article-refereed, Original research)