Failure mode characterization in inkjet-printed cpw lines utilizing a high-frequency network analyzer and post-processed tdr analysis
Contribuinte(s) |
Myllymäki, Sami Putaala, Jussi Hannu, Jari Jantunen, Heli Mäntysalo, Matti Kunnari, Esa |
---|---|
Data(s) |
04/03/2014
04/03/2014
2013
|
Identificador |
1937-8718 |
Idioma(s) |
en_US |
Publicador |
Cambridge, MA : Electromagnetics Academy |
Relação |
Progress in electromagnetics research C Progress in electromagnetics research C 43 Weng Cho Chew |
Direitos |
2 |
Palavras-Chave | #elektroniikka #tulostettava elektroniikka #luotettavuus |
Tipo |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä (Journal article-refereed, Original research) |