Theory of surface noise under Coulomb correlations between carriers and surface states


Autoria(s): Kochelap, V. A. (Viacheslav Aleksandrovich); Sokolov, V. N.; Bulashenko, Oleg; Rubí Capaceti, José Miguel
Contribuinte(s)

Universitat de Barcelona

Resumo

We present a theory of the surface noise in a nonhomogeneous conductive channel adjacent to an insulating layer. The theory is based on the Langevin approach which accounts for the microscopic sources of fluctuations originated from trapping¿detrapping processes at the interface and intrachannel electron scattering. The general formulas for the fluctuations of the electron concentration, electric field as well as the current-noise spectral density have been derived. We show that due to the self-consistent electrostatic interaction, the current noise originating from different regions of the conductive channel appears to be spatially correlated on the length scale correspondent to the Debye screening length in the channel. The expression for the Hooge parameter for 1/f noise, modified by the presence of Coulomb interactions, has been derived

Identificador

http://hdl.handle.net/2445/22096

Idioma(s)

eng

Publicador

American Institute of Physics

Direitos

Noise

(c) American Institute of Physics, 2002

Palavras-Chave #Soroll #Superfícies (Tecnologia) #Camps elèctrics #Circuits de transistors #Semiconductors #Electrònica #Surfaces (Technology) #Electric fields #Transistor circuits #Semiconductors #Electronics
Tipo

info:eu-repo/semantics/article