Secondary Ion Mass Spectrometry (SIMS): principles and applications


Autoria(s): López Fernández, Francisco
Contribuinte(s)

Universitat de Barcelona

Data(s)

07/11/2013

Resumo

This article outlines the basis of the technique and shows some examples of applications in order to exhibit the expectations of this technique invaried scientific fields.

Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166

Identificador

http://hdl.handle.net/2445/32165

Idioma(s)

eng

Publicador

Centres Científics i Tecnològics. Universitat de Barcelona

Direitos

(c) Universitat de Barcelona, 2012

info:eu-repo/semantics/openAccess

Palavras-Chave #Espectrometria de masses #Anàlisi instrumental #Mass spectrometry #Instrumental analysis
Tipo

info:eu-repo/semantics/bookPart