Secondary Ion Mass Spectrometry (SIMS): principles and applications
| Contribuinte(s) |
Universitat de Barcelona |
|---|---|
| Data(s) |
07/11/2013
|
| Resumo |
This article outlines the basis of the technique and shows some examples of applications in order to exhibit the expectations of this technique invaried scientific fields. Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 |
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
Centres Científics i Tecnològics. Universitat de Barcelona |
| Direitos |
(c) Universitat de Barcelona, 2012 info:eu-repo/semantics/openAccess |
| Palavras-Chave | #Espectrometria de masses #Anàlisi instrumental #Mass spectrometry #Instrumental analysis |
| Tipo |
info:eu-repo/semantics/bookPart |
