40% tunneling magnetoresistance after anneal at 380°C for tunnel junctions with iron¿oxide interface layers


Autoria(s): Zhang, Zongzhi; Cardoso, Susana; Freitas, P. P.; Batlle Gelabert, Xavier; Wei, Peng; Barradas, N.; Soares, J. C.
Contribuinte(s)

Universitat de Barcelona

Data(s)

02/03/2012

Identificador

http://hdl.handle.net/2445/22086

Idioma(s)

eng

Publicador

American Institute of Physics

Direitos

Magnetic properties

(c) American Institute of Physics, 2001

Palavras-Chave #Propietats magnètiques #Circuits de transistors #Electrònica de l'estat sòlid #Transistor circuits #Solid state electronics
Tipo

info:eu-repo/semantics/article