40% tunneling magnetoresistance after anneal at 380°C for tunnel junctions with iron¿oxide interface layers
Contribuinte(s) |
Universitat de Barcelona |
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Data(s) |
02/03/2012
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Identificador | |
Idioma(s) |
eng |
Publicador |
American Institute of Physics |
Direitos |
Magnetic properties (c) American Institute of Physics, 2001 |
Palavras-Chave | #Propietats magnètiques #Circuits de transistors #Electrònica de l'estat sòlid #Transistor circuits #Solid state electronics |
Tipo |
info:eu-repo/semantics/article |