Depth profile of uncompensated spins in an exchange bias system


Autoria(s): Roy, S.; Fitzsimmons, M. R.; Park, S.; Dorn, M.; Petracic, Oleg; Roshchin, Igor V.; Li, Zhi-Pan; Batlle Gelabert, Xavier; Morales, R.; Misra, A.; Zhang, Xixiang; Chesnel K.; Kortright, J. B.; Sinha, S. K.; Schuller, Ivan K.
Contribuinte(s)

Universitat de Barcelona

Data(s)

05/07/2010

Resumo

We have used the unique spatial sensitivity of polarized neutron and soft x-ray beams in reflection geometry to measure the depth dependence of magnetization across the interface between a ferromagnet and an antiferromagnet. The net uncompensated magnetization near the interface responds to applied field, while uncompensated spins in the antiferromagnet bulk are pinned, thus providing a means to establish exchange bias.

Identificador

http://hdl.handle.net/2445/13281

Idioma(s)

eng

Publicador

American Physical Society

Direitos

(c) American Physical Society, 2005

info:eu-repo/semantics/openAccess

Palavras-Chave #Materials #Propietats magnètiques #Cristal·lografia #Magnetic properties and materials #Crystallography
Tipo

info:eu-repo/semantics/article