Equilibrium and nonequilibrium gap-state distribution in amorphous silicon


Autoria(s): Asensi López, José Miguel; Andreu i Batallé, Jordi
Contribuinte(s)

Universitat de Barcelona

Data(s)

04/05/2010

Resumo

A general and straightforward analytical expression for the defect-state-energy distribution of a-Si:H is obtained through a statistical-mechanical treatment of the hydrogen occupation for different sites. Broadening of available defect energy levels (defect pool) and their charge state, both in electronic equilibrium and nonequilibrium steady-state situations, are considered. The model gives quantitative results that reproduce different defect phenomena, such as the thermally activated spin density, the gap-state dependence on the Fermi level, and the intensity and temperature dependence of light-induced spin density. An interpretation of the Staebler-Wronski effect is proposed, based on the ''conversion'' of shallow charged centers to neutrals near the middle of the gap as a consequence of hydrogen redistribution.

Identificador

http://hdl.handle.net/2445/9851

Idioma(s)

eng

Publicador

The American Physical Society

Direitos

(c) The American Physical Society, 1993

info:eu-repo/semantics/openAccess

Palavras-Chave #Conductivitat elèctrica #Propietats tèrmiques #Semiconductors amorfs #Electric conductivity #Thermal properties #Amorphous semiconductors
Tipo

info:eu-repo/semantics/article