Determination of the direct band-gap energy of InAlAs matched to InP by photoluminescence excitation spectroscopy
Contribuinte(s) |
Universitat de Barcelona |
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Data(s) |
03/05/2012
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Resumo |
A series of InxAl12xAs samples (0.51,x,0.55) coherently grown on InP was studied in order to measure the band-gap energy of the lattice matched composition. As the substrate is opaque to the relevant photon energies, a method is developed to calculate the optical absorption coefficient from the photoluminescence excitation spectra. The effect of strain on the band-gap energy has been taken into account. For x50.532, at 14 K we have obtained Eg05154966 meV. © 1997 American Institute of Physics. |
Identificador | |
Idioma(s) |
eng |
Publicador |
American Institute of Physics |
Direitos |
(c) American Institute of Physics, 1997 info:eu-repo/semantics/openAccess |
Palavras-Chave | #Microscòpia electrònica #Pel·lícules fines #Electron microscopy #Thin films |
Tipo |
info:eu-repo/semantics/article |