Reconstruction of the SiO2 structure damaged by low-energy Ar-implanted ions
| Contribuinte(s) |
Universitat de Barcelona |
|---|---|
| Data(s) |
02/05/2012
|
| Identificador | |
| Idioma(s) |
eng |
| Publicador |
American Institute of Physics |
| Direitos |
(c) American Institute of Physics, 1998 info:eu-repo/semantics/openAccess |
| Palavras-Chave | #Implantació d'ions #Espectroscòpia #Spectrum analysis #Ion implantation |
| Tipo |
info:eu-repo/semantics/article |
