Ion-beam synthesis of amorphous SiC films: Structural analysis and recrystallization
Contribuinte(s) |
Universitat de Barcelona |
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Data(s) |
02/05/2012
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Identificador | |
Idioma(s) |
eng |
Publicador |
American Institute of Physics |
Direitos |
(c) American Institute of Physics, 1996 info:eu-repo/semantics/openAccess |
Palavras-Chave | #Implantació d'ions #Silici #Ion implantation #Silicon |
Tipo |
info:eu-repo/semantics/article |