Structural and optical properties of dilute InAsN grown by molecular beam epitaxy
Contribuinte(s) |
Universitat de Barcelona |
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Data(s) |
18/07/2012
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Resumo |
We perform a structural and optical characterization of InAs1¿xNx epilayers grown by molecular beam epitaxy on InAs substrates x 2.2% . High-resolution x-ray diffraction HRXRD is used to obtain information about the crystal quality and the strain state of the samples and to determine the N content of the films. The composition of two of the samples investigated is also obtained with time-of-flight secondary ion mass spectroscopy ToF-SIMS measurements. The combined analysis of the HRXRD and ToF-SIMS data suggests that the lattice parameter of InAsN might significantly deviate from Vegard"s law. Raman scattering and far-infrared reflectivity measurements have been carried out to investigate the incorporation of N into the InAsN alloy. N-related local vibrational modes are detected in the samples with higher N content. The origin of the observed features is discussed. We study the compositional dependence of the room-temperature band gap energy of the InAsN alloy. For this purpose, photoluminescence and optical absorption measurements are presented. The results are analyzed in terms of the band-anticrossing BAC model. We find that the room-temperature coupling parameter for InAsN within the BAC model is CNM=2.0 0.1 eV. |
Identificador | |
Idioma(s) |
eng |
Publicador |
American Institute of Physics |
Direitos |
(c) American Institute of Physics , 2010 info:eu-repo/semantics/openAccess |
Palavras-Chave | #Propietats òptiques #Pel·lícules fines #Difracció de raigs X #Semiconductors #Cristal·lografia #Optical properties #Thin films #X-rays diffraction #Semiconductors #Crystallography |
Tipo |
info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion |