Biblioteca Digital

**Autoria(s):** Colomb, Tristan; Krivec, Stefan; Hutter, Herbert; Akatay, Ahmet Ata; Pavillon, Nicolas; Montfort, Frederic; Cuche, Etienne; Kuehn, Jonas; Depeursinge, Christian; Emery, Yves
Data(s)	2010
Identificador	http://serval.unil.ch/?id=serval:BIB_28507C9A5AAD isbn:1094-4087 isiid:000274795700054
Idioma(s)	en
Direitos	info:eu-repo/semantics/openAccess
Fonte	Optics Express, vol. 18, no. 4, pp. 3719-3731
Palavras-Chave	#; PHASE-CONTRAST MICROSCOPY; REFRACTIVE-INDEX; THIN-FILMS; INTERFEROMETRY; COMPENSATION; SIO2-FILMS; SIMS
Tipo	info:eu-repo/semantics/article article

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