Measurement of Photo Capacitance in Amorphous Silicon Photodiodes


Autoria(s): Goncalves, Dora; Fernandes, L. Miguel; Louro, Paula; Vieira, Maria Manuela Almeida Carvalho; Fantoni, Alessandro
Data(s)

21/10/2013

21/10/2013

2013

Resumo

This paper discusses the photodiode capacitance dependence on imposed light and applied voltage using different devices. The first device is a double amorphous silicon pin-pin photodiode; the second one a crystalline pin diode and the last one a single pin amorphous silicon diode. Double amorphous silicon diodes can be used as (de)multiplexer devices for optical communications. For short range applications, using plastic optical fibres, the WDM (wavelength-division multiplexing) technique can be used in the visible light range to encode multiple signals. Experimental results consist on measurements of the photodiode capacitance under different conditions of imposed light and applied voltage. The relation between the capacitive effects of the double diode and the quality of the semiconductor internal junction will be analysed. The dynamics of charge accumulations will be measured when the photodiode is illuminated by a pulsed monochromatic light.

Identificador

GONÇALVES, Dora; FERNANDES, L. Miguel; LOURO, Paula; VIEIRA, Manuela; FANTONI, Alessandro - Measurement of Photo Capacitance in Amorphous Silicon Photodiodes. Technological Innovation for the Internet of Things. ISSN 1868-4238. ISBN 978-642-37290-2. Vol. 394 (2013), p. 547-554.

978-3-642-37290-2

1868-4238

http://hdl.handle.net/10400.21/2761

Idioma(s)

eng

Publicador

Springer-Verlag Berlin

Relação

IFIP Advances in Information and Communication Technology;

Direitos

restrictedAccess

Palavras-Chave #Capacitance #Photodiode #Amorphous silicon
Tipo

conferenceObject