Single-electron measurements with a micromechanical resonator
Contribuinte(s) |
B. Crasemann |
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Data(s) |
01/01/2001
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Resumo |
A mechanical electroscope based on a change in the resonant frequency of a cantilever one micron in size in the presence of charge has recently been fabricated. We derive the decoherence rate of a charge superposition during measurement with such a device using a master equation theory adapted from quantum optics. We also investigate the information produced by such a measurement, using a quantum trajectory approach. Such instruments could be used in mesoscopic electronic systems, and future solid-state quantum computers, so it is useful to know how they behave when used to measure quantum superpositions of charge. |
Identificador | |
Idioma(s) |
eng |
Publicador |
The American Physical Society |
Palavras-Chave | #Optics #Physics, Atomic, Molecular & Chemical #Quantum #Oscillator #States #Master Equation #Quantum optics #Micromechanical resonators #C1 #240201 Theoretical Physics #780102 Physical sciences #020604 Quantum Optics |
Tipo |
Journal Article |