Bond strength of AH Plus and Epiphany sealers on root dentine irradiated with 980 nm diode laser


Autoria(s): ALFREDO, E.; SILVA, S. R. C.; OZORIO, J. E. V.; SOUSA-NETO, M. D.; BRUGNERA-JUNIOR, A.; SILVA-SOUSA, Y. T. C.
Contribuinte(s)

UNIVERSIDADE DE SÃO PAULO

Data(s)

19/10/2012

19/10/2012

2008

Resumo

Aim To evaluate the bond strength of AH Plus and Epiphany sealers to human root canal dentine irradiated with a 980 nm diode laser at different power and frequency parameters, using the push-out test. Methodology Sixty canine roots were sectioned below the cementoenamel junction to provide 4-mm-thick dentine discs that had their root canals prepared with a tapered bur and irrigated with sodium hypochlorite, ethylenediaminetetraacetic acid and distilled water. The specimens were assigned to five groups (n = 12): one control (no laser) and four experimental groups that were submitted to 980 nm diode laser irradiation at different power (1.5 and 3.0 W) and frequency (continuous wave and 100 Hz) parameters. Half of specimens in each group had their canals filled with AH Plus sealer and half with Epiphany. The push-out test was performed and data (MPa) were analysed statistically by ANOVA and Tukey`s test (P < 0.05). The specimens were split longitudinally and examined under SEM to assess the failure modes after sealer displacement. Results The specimens irradiated with the diode laser and filled with AH Plus had significantly higher bond strength values (8.69 +/- 2.44) than those irradiated and filled with Epiphany (3.28 +/- 1.58) and the nonirradiated controls (3.86 +/- 0.60). The specimens filled with Epiphany did not differ significantly to each other or to the control (1.75 +/- 0.69). There was a predominance of adhesive failures at Epiphany-dentine interface (77%) and mixed failures at AH Plus-dentine interface (67%). Conclusions The 980 nm diode laser irradiation of root canal dentine increased the bond strength of AH Plus sealer, but did not affect the adhesion of Epiphany sealer.

Identificador

INTERNATIONAL ENDODONTIC JOURNAL, v.41, n.9, p.733-740, 2008

0143-2885

http://producao.usp.br/handle/BDPI/26327

10.1111/j.1365-2591.2008.01418.x

http://dx.doi.org/10.1111/j.1365-2591.2008.01418.x

Idioma(s)

eng

Publicador

WILEY-BLACKWELL

Relação

International Endodontic Journal

Direitos

restrictedAccess

Copyright WILEY-BLACKWELL

Palavras-Chave #980 nm diode laser #bond strength #push-out test #root canal sealers #CANAL FILLING MATERIAL #SMEAR LAYER REMOVAL #ND-YAG #APICAL LEAKAGE #IN-VITRO #ER-YAG #ADHESION #TEMPERATURE #WAVELENGTHS #OBTURATION #Dentistry, Oral Surgery & Medicine
Tipo

article

original article

publishedVersion