Advanced transmission electron microscopy characterization of semiconductor quantum structures

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Autoria(s): Zou, J; Liao, X; Keast, V J; Cockayne, D J H

Contribuinte(s)	A A Balandin and K L Wang
Data(s)	01/01/2006
Identificador	http://espace.library.uq.edu.au/view/UQ:72981
Publicador	American Scientific Publishers
Palavras-Chave	#291804 Nanotechnology #240202 Condensed Matter Physics - Structural Properties #291499 Materials Engineering not elsewhere classified #780102 Physical sciences #680399 Other #671699 Manufactured products not elsewhere classified #B1
Tipo	Book Chapter